Microscopy, microanalysis, microstructures

Label

• Microscopy, microanalysis, microstructures (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Strain Relaxation of Si/Ge Multilayers Investigated by Transmission Electron Microscopy and High-Resolution X-Ray Diffractometry (Articolo in rivista) (Prodotto della ricerca)
• Elastic Stress Relaxation in HRTEM Specimens of Strained Semiconductor Heterostructures and its Influence on the Image Contrast (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Alternative label

• Microsc. microanal. microstruct. (literal)
• Microscopy, microanalysis, microstructures. (literal)

Language

• mul (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#issn

• 1154-2799 (literal)

Preferred label

• Microscopy, microanalysis, microstructures (literal)

Publisher

• Ed. de physique Les Ulis : FRA (literal)

Incoming links:

Rivista

• Strain Relaxation of Si/Ge Multilayers Investigated by Transmission Electron Microscopy and High-Resolution X-Ray Diffractometry (Articolo in rivista) (Prodotto della ricerca)
• Elastic Stress Relaxation in HRTEM Specimens of Strained Semiconductor Heterostructures and its Influence on the Image Contrast (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)