Investigation of the structural features of porous silicon multilayers by means of GISAXS measurements (Contributo in atti di convegno)

Type
Label
  • Investigation of the structural features of porous silicon multilayers by means of GISAXS measurements (Contributo in atti di convegno) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Alternative label
  • Angeloni M, Moretti L, Mocella V, De Stefano L, Rotiroti L, Rea I, Dardano P, Ferrero C, Bernstorff S (2006)
    Investigation of the structural features of porous silicon multilayers by means of GISAXS measurements
    in E-MRS 2006 Spring meeting, Nizza
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Angeloni M, Moretti L, Mocella V, De Stefano L, Rotiroti L, Rea I, Dardano P, Ferrero C, Bernstorff S (literal)
Titolo
  • Investigation of the structural features of porous silicon multilayers by means of GISAXS measurements (literal)
Prodotto di
Autore CNR

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