A study of nanocrystallinity in nc-Si, nc-Si.C, and nc-Si:Ge films deposited by PECVD (Contributo in atti di convegno)

Type
Label
  • A study of nanocrystallinity in nc-Si, nc-Si.C, and nc-Si:Ge films deposited by PECVD (Contributo in atti di convegno) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Alternative label
  • M.M. Giangregorio, M. Losurdo, A. Sacchetti, P. Capezzuto, G. Bruno (2005)
    A study of nanocrystallinity in nc-Si, nc-Si.C, and nc-Si:Ge films deposited by PECVD
    in SAMIC 2005, Bressanone, Italy
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M.M. Giangregorio, M. Losurdo, A. Sacchetti, P. Capezzuto, G. Bruno (literal)
Titolo
  • A study of nanocrystallinity in nc-Si, nc-Si.C, and nc-Si:Ge films deposited by PECVD (literal)
Prodotto di
Autore CNR

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