Characterization of Erbium doped Nanocrystalline Silicon Thin fIlms by spectroscopic Ellipsometry (Contributo in atti di convegno)

Type
Label
  • Characterization of Erbium doped Nanocrystalline Silicon Thin fIlms by spectroscopic Ellipsometry (Contributo in atti di convegno) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • M. Giangregorio, M. Losurdo, P. Capezzuto, G. Bruno (2003)
    Characterization of Erbium doped Nanocrystalline Silicon Thin fIlms by spectroscopic Ellipsometry
    in Int. Conf. On Spectroscopic ellipsometry, ICSE-3, July 6-11, 2003, Vienna., Vienna
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M. Giangregorio, M. Losurdo, P. Capezzuto, G. Bruno (literal)
Titolo
  • Characterization of Erbium doped Nanocrystalline Silicon Thin fIlms by spectroscopic Ellipsometry (literal)
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