Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy (Articolo in rivista) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• Kanjilal, A; Hansen, JL; Larsen, AN; Kanjilal, D (2006)
  Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy
  in Surface science
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Kanjilal, A; Hansen, JL; Larsen, AN; Kanjilal, D (literal)

Pagina inizio

• 3087 (literal)

Pagina fine

• 3092 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 600 (literal)

Rivista

• Surface science (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Aarhus Univ, Dept Phys & Astron, DK-8000 Aarhus C, Denmark; Inter Univ Accelerator Ctr, New Delhi 110067, India (literal)

Titolo

• Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy (literal)

Abstract

• We demonstrate a gradual surface modification process of relaxed Si0.5Ge0.5 alloy films by 100 MeV An beam with fluence varying between 5 x 10(10) and I X 10(12) ions/cm(2) at 80 K by means of atomic force microscopy (AFM). Presence of Ge quantum dots (QDs) was found in the virgin sample. The disappearance of the QDs were noticed when the samples were irradiated with a fluence of 5 x 10(10) ions/cm(2). Craters were found developing at a fluence of I x 10(11) ions/cm(2). Apart from the evolution of the craters, blisters were also detected at a fluence of I X 10(12) ions/cm(2). Variation of the average root mean square value of the surface roughness as a function of fluence was examined. (c) 2006 Elsevier B.V. All rights reserved. (literal)

Prodotto di

• Nanofabbricazione e fenomeni di superficie interfaccia alla nanoscala (MD.P06.013.001) (Modulo)

Autore CNR

• ALOKE KANJILAL (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ALOKE KANJILAL (Unità di personale interno)

Prodotto

• Nanofabbricazione e fenomeni di superficie interfaccia alla nanoscala (MD.P06.013.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Surface science (Rivista)

Insieme di parole chiave di

• Parole chiave di "Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy" (Insieme di parole chiave)