Breakdown Kinetics at nanometer Scale of Innovative MOS Devices by Conductive Atomic Force microscopy (Articolo in rivista)

Type
Label
  • Breakdown Kinetics at nanometer Scale of Innovative MOS Devices by Conductive Atomic Force microscopy (Articolo in rivista) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Alternative label
  • Raineri V, Fiorenza P, Lo Nigro R (2006)
    Breakdown Kinetics at nanometer Scale of Innovative MOS Devices by Conductive Atomic Force microscopy
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Raineri V, Fiorenza P, Lo Nigro R (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IMM-CNR Catania (literal)
Titolo
  • Breakdown Kinetics at nanometer Scale of Innovative MOS Devices by Conductive Atomic Force microscopy (literal)
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