Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals (Articolo in rivista) (literal)

Anno

• 2010-01-01T00:00:00+01:00 (literal)

Alternative label

• Raulo A.; Marchini L.; Paternoster G.; Perillo E.; Paiano P.; Mancini A. M.; Zha M.; Zappettini A. (2010)
  Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals
  in IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference.; IEEE, Institute of electrical and electronics engineers, New York (Stati Uniti d'America)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Raulo A.; Marchini L.; Paternoster G.; Perillo E.; Paiano P.; Mancini A. M.; Zha M.; Zappettini A. (literal)

Pagina inizio

• 3678 (literal)

Pagina fine

• 3682 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• ID_PUMA: cnr.imem/2010-A0-063 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• Catalog CPF10NSS-CDR (literal)

Rivista

• IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

• In: Conference Record IEEE 2010 NSS/MIC/RTSD, vol. Catalog #: 06CH37832C article n. R03-2. IEEE, 2010. (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Università di Napoli Federico II, CNR-IMEM, Parma, Università del Salento (literal)

Titolo

• Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals (literal)

Abstract

• Rutherford Backscattering Spectrometry (RBS) using 6 MeV alpha particles and X-Ray Fluorescence (XRF) using a Pdanode X-Ray generator were performed to characterize Au and Pt contacts deposited by electroless technique and thermal evaporation on differently treated surfaces of CdZnTe and CdTe crystals. The aim of this study is to understand and improve the structure of the material-electrode interface. The thickness, the stoichiometry and the concentration profiles of platinum, gold, cadmium, zinc, tellurium and oxygen present at the surface layers were determined. The distribution of Cd deficiency at the interface layers was profiled using simulations and showed complex profiles in the samples, which can greatly affect the electrical quality of the detectors. (literal)

Editore

• IEEE, Institute of electrical and electronics engineers (Editore)

Prodotto di

• Sensori di raggi X (SP.P02.003.002) (Modulo)
• Istituto dei materiali per l'elettronica ed il magnetismo (IMEM) (Istituto)

Autore CNR

• MINGZHENG ZHA (Persona)
• ANDREA ZAPPETTINI (Persona)
• Laura Marchini (Persona)

Insieme di parole chiave

• Keywords of "Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto dei materiali per l'elettronica ed il magnetismo (IMEM) (Istituto)
• Sensori di raggi X (SP.P02.003.002) (Modulo)

Autore CNR di

• MINGZHENG ZHA (Persona)
• ANDREA ZAPPETTINI (Persona)
• Laura Marchini (Persona)

Editore di

• IEEE, Institute of electrical and electronics engineers (Editore)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. (Rivista)

Insieme di parole chiave di

• Keywords of "Ion Beam (RBS) and XRF Analysis of Metal Contacts Deposited on CdZnTe and CdTe Crystals" (Insieme di parole chiave)