http://www.cnr.it/ontology/cnr/individuo/prodotto/ID59159
Advances in quantum metrology (Articolo in rivista)
- Type
- Label
- Advances in quantum metrology (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Giovannetti V., S. Lloyd, and L. Maccone (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- DOI: 10.1038/NPHOTON.2011.35 (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- NEST, Scuola Normale Superiore and Istituto Nanoscienze-CNR, piazza dei Cavalieri 7, I-56126 Pisa, Italy. (V. Giovannetti)
Research Lab of Electronics and Deptartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA. (S. Lloyd)
Dip. Fisica 'A. Volta', INFN Sezione di Pavia, University of Pavia, via Bassi 6, I-27100 Pavia, Italy. (L. Maccone) (literal)
- Titolo
- Advances in quantum metrology (literal)
- Abstract
- The statistical error in any estimation can be reduced by repeating the measurement and averaging the results. The central limit theorem implies that the reduction is proportional to the square root of the number of repetitions. Quantum metrology is the use of quantum techniques such as entanglement to yield higher statistical precision than purely classical approaches. In this Review, we analyse some of the most promising recent developments of this research field and point out some of the new experiments. We then look at one of the major new trends of the field: analyses of the effects of noise and experimental imperfections.
(literal)
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