X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation Proceedings of the EMRS 2009 Spring Meeting - Symposium R Strasbourg, France, June 8-June 12 2009 (Articolo in rivista)

Type
Label
  • X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation Proceedings of the EMRS 2009 Spring Meeting - Symposium R Strasbourg, France, June 8-June 12 2009 (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • Boscherini F., Birkholz M., Buffiere J.Y., Chateigner D., Fewster P.F. and Heun S. (2010)
    X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation Proceedings of the EMRS 2009 Spring Meeting - Symposium R Strasbourg, France, June 8-June 12 2009
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Boscherini F., Birkholz M., Buffiere J.Y., Chateigner D., Fewster P.F. and Heun S. (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Univ Bologna, I-40126 Bologna, Italy 2. IHP Frankfurt Oder, Frankfurt, Germany 3. Inst Natl Sci Appl, F-69621 Villeurbanne, France 4. CRISMAT ENSICAEN, Caen, France 5. IUT Caen UCBN, Caen, France 6. PANalytical, Brighton, E Sussex England 7. Scuola Normale Super Pisa, Pisa, Italy 8. CNR INFM, NEST, Pisa, Italy (literal)
Titolo
  • X-ray Techniques for Advanced Materials, Nanostructures and Thin Films: from Laboratory Sources to Synchrotron Radiation Proceedings of the EMRS 2009 Spring Meeting - Symposium R Strasbourg, France, June 8-June 12 2009 (literal)
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Autore CNR

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