http://www.cnr.it/ontology/cnr/individuo/prodotto/ID58719

Measuring magnetic profiles at manganite surfaces with monolayer resolution (Articolo in rivista)

Type

Articolo in rivista (Classe)
Prodotto della ricerca (Classe)

Label

Measuring magnetic profiles at manganite surfaces with monolayer resolution (Articolo in rivista) (literal)

Anno

2010-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

10.1016/j.jmmm.2009.05.022 (literal)

Alternative label

Verna, A.1; Davidson, Bruce A.1; Szeto, Y.2; Petrov, A. Yu.1; Mirone, A.3; Giglia, A.1; Mahne, N.1; Nannarone, S.1 (2010)
Measuring magnetic profiles at manganite surfaces with monolayer resolution
in Journal of magnetism and magnetic materials; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Verna, A.1; Davidson, Bruce A.1; Szeto, Y.2; Petrov, A. Yu.1; Mirone, A.3; Giglia, A.1; Mahne, N.1; Nannarone, S.1 (literal)

Pagina inizio

1212 (literal)

Pagina fine

1216 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

http://www.sciencedirect.com/science/article/pii/S0304885309005393 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

322 (literal)

Rivista

Journal of magnetism and magnetic materials (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

5 (literal)

Note

ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

1 CNR-INFM TASC National Laboratory, Area Science Park (Basovizza), 34012 Trieste, Italy 2 Department of Physics, Delft University of Technology, 2628 CJ Delft, The Netherlands 3 European Synchrotron Radiation Facility, 6 rue Jules Horowitz, Boîte Postale 220, 38043 Grenoble, France 4 Dipartimento di Ingegneria dei Materiali e dell'Ambiente, Università di Modena e Reggio Emilia, Via Vignolese 905, 41100 Modena, Italy (literal)

Titolo

Measuring magnetic profiles at manganite surfaces with monolayer resolution (literal)

Abstract

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic \"dead layer\" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra synchrotron, Trieste). Measurements were carried out in specular reflectivity geometry, switching the left/right elliptical polarization of light as well as the magnetization direction in the scattering plane. Spectra were collected across the Mn L2,3 edge for at least four different grazing angles to better analyse the interference phenomena. The resulting reflectivity spectra have been carefully fit to obtain the magnetization profiles, minimizing the number of free parameters as much as possible. Optical constants of the samples (real and imaginary part of the refractive index) in the interested frequency range are obtained through absorption measurements in two magnetization states and subsequent Kramers-Krönig transformation, allowing quantitative fits of the magnetization profile at different temperatures. We apply this method to the study of air-exposed surfaces of epitaxial La2/3Sr1/3MnO3 (0 0 1) films grown on SrTiO3 (0 0 1) substrates. (literal)

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