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Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7-delta 0-pi Josephson Junctions (Articolo in rivista)

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Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7-delta 0-pi Josephson Junctions (Articolo in rivista) (literal)

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Cedergren, K; Kirtley, JR; Bauch, T; Rotoli, G; Troeman, A; Hilgenkamp, H; Tafuri, F; Lombardi, F (2010)
Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7-delta 0-pi Josephson Junctions
in Physical review letters (Print); The American Physical Society, Ridge, NY (Stati Uniti d'America)
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Cedergren, K; Kirtley, JR; Bauch, T; Rotoli, G; Troeman, A; Hilgenkamp, H; Tafuri, F; Lombardi, F (literal)

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Quantum Device Physics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-412 96 Go¨teborg, Sweden Center for Probing the Nanoscale, Stanford University, Stanford, California 94304, USA CNISM and DIMEG, Universita` di L'Aquila, Localita` Monteluco, 67040 L'Aquila, Italy Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, Post Office Box 217, 7500 AE Enschede, The Netherlands Dipartimento Ingegneria dell'Informazione, Seconda Universita` di Napoli e CNR-SPIN, Aversa (CE), Italy (literal)

Titolo

Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7-delta 0-pi Josephson Junctions (literal)

Abstract

We have investigated the static and dynamic properties of long YBa2Cu3O7?? 0-? Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0-? Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0-? Josephson junctions. (literal)

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