Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (Articolo in rivista)

Type
Label
  • Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1088/0957-4484/21/11/115204 (literal)
Alternative label
  • Di Bartolomeo, A; Rinzan, M; Boyd, AK; Yang, YF; Guadagno, L; Giubileo, F; Barbara, P (2010)
    Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes
    in Nanotechnology (Bristol. Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Di Bartolomeo, A; Rinzan, M; Boyd, AK; Yang, YF; Guadagno, L; Giubileo, F; Barbara, P (literal)
Pagina inizio
  • 115204 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 21 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 9 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 Dipartimento di Fisica 'E R Caianiello' and Centro Interdipartimentale di Ricerca NANOMATES, Universit`a di Salerno, 84084 Fisciano (Sa), Italy 2 Physics Department, Georgetown University, Washington, DC 20057-1228, USA 3 Dipartimento di Ingegneria Chimica e Alimentare, Universit`a di Salerno, 84084 Fisciano (Sa), Italy 4 CNR-SPIN Salerno, 84084 Fisciano (Sa), Italy (literal)
Titolo
  • Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (literal)
Abstract
  • We study field-effect transistors made of single- and double-walled carbon nanotube networks for applications as memory devices. The transfer characteristics of the transistors exhibit a reproducible hysteresis which enables their use as nano-sized memory cells with operations faster than 10 ms, endurance longer than 10+4 cycles and charge retention of a few hours in air. We propose water enhanced charge trapping at the SiO2/air interface close to the nanotubes as the dominant mechanism for charge storage. We show that charge storage can be improved by limiting exposure of the device to air. (literal)
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