http://www.cnr.it/ontology/cnr/individuo/prodotto/ID58313
Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (Articolo in rivista)
- Type
- Label
- Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (Articolo in rivista) (literal)
- Anno
- 2010-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1088/0957-4484/21/11/115204 (literal)
- Alternative label
Di Bartolomeo, A; Rinzan, M; Boyd, AK; Yang, YF; Guadagno, L; Giubileo, F; Barbara, P (2010)
Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes
in Nanotechnology (Bristol. Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Di Bartolomeo, A; Rinzan, M; Boyd, AK; Yang, YF; Guadagno, L; Giubileo, F; Barbara, P (literal)
- Pagina inizio
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1 Dipartimento di Fisica 'E R Caianiello' and Centro Interdipartimentale di Ricerca NANOMATES, Universit`a di Salerno, 84084 Fisciano (Sa), Italy
2 Physics Department, Georgetown University, Washington, DC 20057-1228, USA
3 Dipartimento di Ingegneria Chimica e Alimentare, Universit`a di Salerno, 84084 Fisciano (Sa), Italy
4 CNR-SPIN Salerno, 84084 Fisciano (Sa), Italy (literal)
- Titolo
- Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled carbon nanotubes (literal)
- Abstract
- We study field-effect transistors made of single- and double-walled carbon nanotube networks
for applications as memory devices. The transfer characteristics of the transistors exhibit a
reproducible hysteresis which enables their use as nano-sized memory cells with operations
faster than 10 ms, endurance longer than 10+4 cycles and charge retention of a few hours in air.
We propose water enhanced charge trapping at the SiO2/air interface close to the nanotubes as
the dominant mechanism for charge storage. We show that charge storage can be improved by
limiting exposure of the device to air. (literal)
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- Autore CNR
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