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A high resolution photoemission study of phenol adsorption on Si (100) 2x1 (Articolo in rivista)
- Type
- Label
- A high resolution photoemission study of phenol adsorption on Si (100) 2x1 (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Alternative label
M.P. Casaletto, M. Carbone, M.N. Piancastelli, K. Horn, K. Weiss, R. Zanoni (2005)
A high resolution photoemission study of phenol adsorption on Si (100) 2x1
in Surface science
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M.P. Casaletto, M. Carbone, M.N. Piancastelli, K. Horn, K. Weiss, R. Zanoni (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Istituto per lo Studio dei Materiali Nanostrutturati (ISMN), CNR, Via Ugo La Malfa 153, 90146 Palermo, Italy
Dipartimento di Scienze e Tecnologie Chimiche, Universita' Tor Vergata, Roma, Italy
Department of Molecular Physics, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany
Dipartimento di Chimica, Universita' di Roma ''La Sapienza'', Roma, Italy (literal)
- Titolo
- A high resolution photoemission study of phenol adsorption on Si (100) 2x1 (literal)
- Abstract
- The adsorption of a bi-functional organic molecule like phenol on Si(1 00)2 · 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(1 00)2 · 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si-O and Si-H bonds, as a consequence of the cleavage of the C-O-H bond and the binding of the fragments (CO- group and H atom) to the Si(1 00)2 · 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si-OC and Si-H components have been observed as a function of phenol exposure. The presence of the phenoxide (CO-) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C-O group) and carbon atoms of the aromatic ring, respectively. (literal)
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