Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators (Articolo in rivista) (literal)

Anno

• 2005-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/j.elspec.2004.06.016 (literal)

Alternative label

• Paparazzo E. (2005)
  Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators
  in Journal of electron spectroscopy and related phenomena (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Paparazzo E. (literal)

Pagina inizio

• 219 (literal)

Pagina fine

• 231 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• This article appears in a Special Issue of the journal of which I was the Guest (and sole) Editor. The details of the Special Issue are as follows: \"Electron energy loss spectroscopy in the electron microscope\" Journal of Electron Spectroscopy and Related Phenomena, Vol. 143 (2005) 41-257. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 143 (literal)

Rivista

• Journal of electron spectroscopy and related phenomena (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• ISM - CNR (literal)

Titolo

• Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators (literal)

Abstract

• The potential of reflected electron energy loss microscopy (REELM) are tested in surface and interface studies of metals, semiconductors and insulators. We present spectroscopic analyses of loss signals occurring at 5–30 eV of the elastic peak, and microscopic analyses based on the same signals performed via spot mode, as well as via linescanning and imaging modes. Materials investigated include a UHV cleaved InSb surface, InP/SiO2 and GaAs/Au systems, W tips for use in an STM microscope, a ZrO2 single crystal, and an archaeological bronze covered with a thick patina. Advantages and shortcomings of REELM are outlined against the diagnostic value of parallel results obtained by scanning Auger microscopy (SAM) techniques. Although comparatively poor focussing powers preclude the attainment of high spatial resolution, and spectral interference problems may hinder the chemical characterization of multi-phase materials, REELM features unique capabilities. Among others, these include a chemical contrast that is much superior to that of SAM, the possibility of characterizing the coverage distribution of adlayer surface species, as well as of investigating the microchemistry of insulators’ surfaces. The first application of REELM in the analysis of archaeological materials is presented. (literal)

Prodotto di

• Institute of structure of matter (ISM) (Istituto)
• Indagini Innovative per il monitoraggio delle superfici di manufatti di interesse architettonico, storico-artistico e archeologico (PC.P03.009.005) (Modulo)

Autore CNR

• ERNESTO PAPARAZZO (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ERNESTO PAPARAZZO (Unità di personale interno)

Prodotto

• Institute of structure of matter (ISM) (Istituto)
• Indagini Innovative per il monitoraggio delle superfici di manufatti di interesse architettonico, storico-artistico e archeologico (PC.P03.009.005) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of electron spectroscopy and related phenomena (Rivista)

Insieme di parole chiave di

• Parole chiave di "Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators" (Insieme di parole chiave)