Residual stress analysis of thin films and coatings through XRD2 experiments (Articolo in rivista)

Type
Label
  • Residual stress analysis of thin films and coatings through XRD2 experiments (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Alternative label
  • Gelfi M., Bontempi E., Roberti R., Armelao L., Depero L.E. (2004)
    Residual stress analysis of thin films and coatings through XRD2 experiments
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Gelfi M., Bontempi E., Roberti R., Armelao L., Depero L.E. (literal)
Pagina inizio
  • 143 (literal)
Pagina fine
  • 147 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 450 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Residual stress analysis of thin films and coatings through XRD2 experiments (literal)
Prodotto di
Autore CNR

Incoming links:


Prodotto
Autore CNR di
data.CNR.it