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Influence of process parameters on the morphology of Au/SiO2 nanocomposites synthesized by radio-frequency sputtering (Articolo in rivista)
- Type
- Label
- Influence of process parameters on the morphology of Au/SiO2 nanocomposites synthesized by radio-frequency sputtering (Articolo in rivista) (literal)
- Anno
- 2004-01-01T00:00:00+01:00 (literal)
- Alternative label
D. Barreca, A. Gasparotto, E. Tondello, G. Bruno, M. Losurdo (2004)
Influence of process parameters on the morphology of Au/SiO2 nanocomposites synthesized by radio-frequency sputtering
in Journal of applied physics
(literal)
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- D. Barreca, A. Gasparotto, E. Tondello, G. Bruno, M. Losurdo (literal)
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- Rivista
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- Note
- ISI Web of Science (WOS) (literal)
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- 1: ISTM-CNR and INSTM, Department of Chemical Sciences, Padova University, Via Marzolo, 1-35131 Padova, Italy
2,3,4: Department of Chemical Sciences, Padova University and INSTM, Via Marzolo, 1-35131 Padova, Italy
5,6: IMIP-CNR and INSTM, Via Orabona, 4-70126 Bari, Italy (literal)
- Titolo
- Influence of process parameters on the morphology of Au/SiO2 nanocomposites synthesized by radio-frequency sputtering (literal)
- Abstract
- Metal nanoparticles on oxide matrices have gained a markedly increasing consideration with regard
to both scientific and applicative purposes, thanks to the possibility of tailoring the system
characteristics by a proper choice of the preparation route and the processing conditions. In the
present work, Au/SiO2 nanocomposites were prepared by radio-frequency (rf) sputtering of gold
from Ar plasmas on amorphous silica substrates. Particular attention was devoted to the influence of
the synthesis parameters on the chemicophysical properties of the final nanosystems. To this regard,
both in situ and ex situ characterization techniques were adopted. In particular, laser reflection
interferometry was employed for an in situ monitoring of growth processes, while ex situ analyses
were specifically dedicated to the investigation of Au/SiO2 nanostructure, chemical composition,
optical properties, and surface morphology (glancing-incidence x-ray diffraction, transmission
electron microscopy, spectroscopic ellipsometry, x-ray photoelectron spectroscopy,
ultraviolet-visible absorption, and atomic force microscopy). The obtained results showed the
possibility of tailoring the Au/SiO2 morphology from clusterlike to islandlike systems or continuous
films, with consequent modification of the optical properties, by a proper choice of total pressure,
rf power, deposition time, and growth temperature. (literal)
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