Surface structure and composition of nanocrystalline SnO2 thin films obtained by Chemical Vapor Deposition (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Surface structure and composition of nanocrystalline SnO2 thin films obtained by Chemical Vapor Deposition (Articolo in rivista) (literal)

Anno

• 2004-01-01T00:00:00+01:00 (literal)

Alternative label

• D. Barreca, E. Bontempi, L.E. Depero, C. Maragno, E. Tondello (2004)
  Surface structure and composition of nanocrystalline SnO2 thin films obtained by Chemical Vapor Deposition
  in Materials Research Society symposia proceedings
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• D. Barreca, E. Bontempi, L.E. Depero, C. Maragno, E. Tondello (literal)

Pagina inizio

• s7.8.1 (literal)

Pagina fine

• s7.8.6 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 822 (literal)

Rivista

• Materials Research Society symposia proceedings (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 6 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1: ISTM-CNR and INSTM - Department of Chemical Sciences - Padova University - Via Marzolo, 1 - 35131 Padova, Italy 2,3: INFM and Structural Chemistry Laboratory - Department of Mechanical Engineering - Brescia University - Via Branze, 38 - 25123 Brescia, Italy 4,5: Department of Chemical Sciences and INSTM - Padova University - Via Marzolo, 1 - 35131 Padova, Italy (literal)

Titolo

• Surface structure and composition of nanocrystalline SnO2 thin films obtained by Chemical Vapor Deposition (literal)

Abstract

• Nanocrystalline SnO2 thin films were synthesized by Chemical Vapor Deposition on Si(100) and Al2O3 substrates using bis(diethylamino)dimethylstannane(IV) [(CH3)2Sn(N(C2H5)2)2] as precursor. Film growth was performed at 400-500°C in an O2(H2O)+N2 atmosphere, with the aim of studying the effects of the synthesis conditions on the coating properties. The sample chemical composition and surface morphology were analyzed by X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM), while their structural features were investigated by Glancing Incidence X-ray Diffraction (GIXRD) and X-ray Reflectivity (XRR). In this paper, the attention is focused on the interplay between film nanostructure and morphology, with particular regard to the influence of the growth surface. (literal)

Prodotto di

• Progettazione molecolare di nanosistemi organizzati (PM.P05.007.001) (Modulo)
• Institute of molecular science and technologies (ISTM) (Istituto)

Autore CNR

• DAVIDE BARRECA (Unità di personale interno)

Incoming links:

Prodotto

• Institute of molecular science and technologies (ISTM) (Istituto)
• Progettazione molecolare di nanosistemi organizzati (PM.P05.007.001) (Modulo)

Autore CNR di

• DAVIDE BARRECA (Unità di personale interno)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Materials Research Society symposia proceedings (Rivista)