http://www.cnr.it/ontology/cnr/individuo/prodotto/ID47423
Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: a Morphological and Structural Investigation (Articolo in rivista)
- Type
- Label
- Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: a Morphological and Structural Investigation (Articolo in rivista) (literal)
- Anno
- 2003-01-01T00:00:00+01:00 (literal)
- Alternative label
M. Acciarri, C. Canevali, C.M. Mari, M. Mattoni, R. Ruffo, R. Scotti, F. Morazzoni, D. Barreca, L. Armelao, E. Tondello, E. Bontempi, L.E. Depero (2003)
Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: a Morphological and Structural Investigation
in Chemistry of materials
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. Acciarri, C. Canevali, C.M. Mari, M. Mattoni, R. Ruffo, R. Scotti, F. Morazzoni, D. Barreca, L. Armelao, E. Tondello, E. Bontempi, L.E. Depero (literal)
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- Rivista
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- Note
- ISI Web of Science (WOS) (literal)
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- 1,2,3,4,5,6,7: INSTM and Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via Cozzi 53, 20125 Milano, Italy
8,9,10: Istituto di Scienze e Tecnologie Molecolari del CNR and INSTM, Dipartimento di Chimica, Università di Padova, Via Marzolo, 1, 35131 Padova, Italy
11,12: INSTM and Laboratorio di Strutturistica Chimica, Dipartimento di Ingegneria Meccanica, Università di Brescia, Via Branze 38, 25123 Brescia, Italy (literal)
- Titolo
- Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: a Morphological and Structural Investigation (literal)
- Abstract
- The thermal evolution of sol-gel SnO2-based thin films was explored by investigating
their structural and morphological features. Nanostructured SnO2 and Pt-doped SnO2 layers
were obtained using tetra(tert-butoxy)tin(IV) and Pt(II) acetlylacetonate as precursors. Films
were prepared by spin coating from ethanol solutions with different viscosity. After drying
at room temperature, they were annealed in air at 673 and 973 K. The surface morphology
was analyzed by scanning electron microscopy, atomic force microscopy, and scanning nearfield
optical microscopy. The structural characterization was performed by means of glancing
incidence X-ray diffraction and microdiffraction. Both drying at room temperature and
thermal treatment at 673 K resulted in the formation of holes on the surface and inside the
films. Their distribution and average dimension were found to depend mainly on the viscosity
of the sol precursor, and on the presence of Pt in the films. After annealing at 973 K, surface
segregation of PtOx phases and partial filling of the surface holes occurred. The effects of
morphology on the electrical transport properties are discussed on the basis of sensitivity,
S, measurements (S ) Rair/RCO, where Rair and RCO stand for the resistance in air and CO/
air, respectively). (literal)
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