Structural Characterization of sol-gel lanthanum cobaltite thin films (Articolo in rivista)

Type
Label
  • Structural Characterization of sol-gel lanthanum cobaltite thin films (Articolo in rivista) (literal)
Anno
  • 2002-01-01T00:00:00+01:00 (literal)
Alternative label
  • E. Bontempi, L. Armelao, D. Barreca, L. Bertolo, G. Bottaro, E. Pierangelo, L.E. Depero (2002)
    Structural Characterization of sol-gel lanthanum cobaltite thin films
    in Crystal engineering
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • E. Bontempi, L. Armelao, D. Barreca, L. Bertolo, G. Bottaro, E. Pierangelo, L.E. Depero (literal)
Pagina inizio
  • 291 (literal)
Pagina fine
  • 298 (literal)
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  • 5 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1,7: INSTM and Laboratorio di Strutturistica Chimica, Dipartimento di Ingegneria Meccanica, Università di Brescia, Via Branze, 38, 25123 Brescia, Italy 2,3: INSTM and CNR-ISTM, Dipartimento Chimica Inorganica, Metallorganica e Analitica, Università di Padova, Via Marzolo 1, I-35131 Padova, Italy 4,5,6: INSTM and Dipartimento Chimica Inorganica, Metallorganica e Analitica, Università di Padova, Via Loredan 4, I-35131 Padova, Italy (literal)
Titolo
  • Structural Characterization of sol-gel lanthanum cobaltite thin films (literal)
Abstract
  • The present paper is focused on structural, microstructural and compositional studies on nanophasic LaCoO3 thin films obtained by the sol-gel route. The sample structure and microstructure were investigated by Glancing Incidence X-Ray Diffraction (GIXRD) and X-Ray microdiffraction (MicroXRD), whereas the surface and in-depth chemical composition was studied by X-Ray Photoelectron Spectroscopy (XPS). All the films are structurally homogeneous and not textured. A cubic-to-rhomboedral phase transition was detected after the thermal treatment at 800°C. Evidence of residual stress was found by GIXRD patterns collected at different incidence angles. After thermal annealing at 1000°C, only the crystalline La2O3 phase was detected. (literal)
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