http://www.cnr.it/ontology/cnr/individuo/prodotto/ID3785
High-field transport in semiconductor superlattices for interacting Wannier-Stark levels (Articolo in rivista)
- Type
- Label
- High-field transport in semiconductor superlattices for interacting Wannier-Stark levels (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Alternative label
Guida, A; Reggiani, L; Rosini, M (2008)
High-field transport in semiconductor superlattices for interacting Wannier-Stark levels
in Superlattices and microstructures
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- Guida, A; Reggiani, L; Rosini, M (literal)
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- ISI Web of Science (WOS) (literal)
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- \"[Rosini, Marcello] Univ Modena & Reggio Emilia, Dipartimento Fis, I-4100 Modena, Italy; [Rosini, Marcello] CNR INFM, Natl Res Ctr S3, I-4100 Modena, Italy; [Reggiani, Lino] Univ Salento, Dipartimento Ingn Innovaz, I-73100 Lecce, Italy; [Reggiani, Lino] Univ Salento, CNISM, I-73100 Lecce, Italy; [Guida, Angelo] Univ Salento, Dipartimento Fis, I-73100 Lecce, Italy (literal)
- Titolo
- High-field transport in semiconductor superlattices for interacting Wannier-Stark levels (literal)
- Abstract
- We developed a microscopic theory of electron transport in superlattices within the Wannier-Stark approach by including the interaction associated with Zener tunneling between the energy levels pertaining to adjacent quantum wells. By using a Monte Carlo technique we have simulated the hopping motion associated with absorption and emission of polar optical phonons and determined the main transport parameters for the case of a GaAs/GaAlAs structure at room temperature. Interaction between the levels is found to be responsible for a systematic increase of the level energy with respect to the bottom of the quantum well at electric fields above about 20 kV/cm. When compared with the non-interacting case, at the highest fields the average carrier energy evidences a consistent increase, which leads to a significant softening of the negative slope of both the drift velocity and diffusivity versus electric field behavior. (C) 2008 Elsevier Ltd. All rights reserved. (literal)
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