Bayes credibility intervals for the left-truncated exponential distribution (Articolo in rivista)

Type
Label
  • Bayes credibility intervals for the left-truncated exponential distribution (Articolo in rivista) (literal)
Anno
  • 1994-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/0026-2714(94)90285-2 (literal)
Alternative label
  • Calabria R., Pulcini G. (1994)
    Bayes credibility intervals for the left-truncated exponential distribution
    in Microelectronics and reliability
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Calabria R., Pulcini G. (literal)
Pagina inizio
  • 1897 (literal)
Pagina fine
  • 1907 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 34 (literal)
Rivista
Note
  • Google Scholar (literal)
  • Scopu (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto Motori, CNR, Napoli. (literal)
Titolo
  • Bayes credibility intervals for the left-truncated exponential distribution (literal)
Abstract
  • In this paper, a Bayes approach for statistical inference on life characteristics is proposed, when the underlying lifetime distribution has the left-truncated exponential density function. The proposed Bayes procedure provides credibility intervals on several life characteristics of great interest to the applied reliability engineer, when the experimental data are collected under a randomly censored sampling. The prior technical knowledge is expressed in the form of a prior density on the reliability level at a prefixed time in conjunction with an upper bound on the location parameter. The statistical properties of the proposed Bayes procedure are compared, via Monte Carlo simulation, with those of the Bayes procedure under the noninformative prior, when both correct and uncorrect prior information on the reliability is available. A numerical example is used for illustration and comparison. (literal)
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