Experimental verification of dynamical diffraction focusing by a bent crystal wedge in Laue geometry (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Experimental verification of dynamical diffraction focusing by a bent crystal wedge in Laue geometry (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1107/S0021889808017883 (literal)

Alternative label

• Mocella V ; Ferrero C ; Hrdy J ; Wright J ; Pascarelli S ; Hoszowska J (2008)
  Experimental verification of dynamical diffraction focusing by a bent crystal wedge in Laue geometry
  in Journal of applied crystallography; WILEY-BLACKWELL, MALDEN 02148,MA (Stati Uniti d'America)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Mocella V ; Ferrero C ; Hrdy J ; Wright J ; Pascarelli S ; Hoszowska J (literal)

Pagina inizio

• 695 (literal)

Pagina fine

• 700 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 41 (literal)

Rivista

• Journal of applied crystallography (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1. CNR IMM Sez Napoli, I-80131 Naples, Italy 2. European Synchrotron Radiat Facil, F-38043 Grenoble, France 3. Acad Sci Czech Republic, Inst Phys, Prague 18221 8, Czech Republic (literal)

Titolo

• Experimental verification of dynamical diffraction focusing by a bent crystal wedge in Laue geometry (literal)

Abstract

• Recent X-ray optical experiments have validated previous theoretical work on focusing by bent crystals in Laue geometry. It was shown that a suitable choice of the crystal thickness significantly improves the focusing performance of the crystal by combining the dynamical focusing of the Borrmann triangle with the geometrical focusing obtained by the crystal bending. The best focus size achieved during the experiments was less than 5 mm and is in practice limited by the source demagnification for the considered setup (literal)

Editore

• WILEY-BLACKWELL (Editore)

Prodotto di

• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)
• Institute for microelectronics and microsystems (IMM) (Istituto)

Autore CNR

• VITO MOCELLA (Persona)

Incoming links:

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)

Autore CNR di

• VITO MOCELLA (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of applied crystallography (Rivista)

Editore di

• WILEY-BLACKWELL (Editore)