Scanning electron microscopy of thinned specimens: From multilayers to biological samples (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Scanning electron microscopy of thinned specimens: From multilayers to biological samples (Articolo in rivista) (literal)

Anno

• 2007-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1063/1.2724917 (literal)

Alternative label

• Morandi V, Merli PG, Quaglino D (2007)
  Scanning electron microscopy of thinned specimens: From multilayers to biological samples
  in Applied physics letters; AIP, American institute of physics, Melville, NY (Stati Uniti d'America)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Morandi V, Merli PG, Quaglino D (literal)

Pagina inizio

• 163113-I (literal)

Pagina fine

• 163113-III (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 90 (literal)

Rivista

• Applied physics letters (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 3 (literal)

Note

• Scopu (literal)
• ISI Web of Science (WOS) (literal)
• Google Scholar (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR, IMM, Sect Bologna, I-40129 Bologna, Italy; Univ Modena, Dept Biomed Sci, I-41100 Modena, Italy (literal)

Titolo

• Scanning electron microscopy of thinned specimens: From multilayers to biological samples (literal)

Abstract

• The rules governing image formation of thin specimens in scanning and scanning transmission electron microscopy at low energy, deduced from the observation of semiconductor multilayers, were validated on specimens defined by a much more complex structure as the biological ones. It is shown that for a suitable specimen thickness it is possible to have, at the same time, backscattered electron images and scanning transmission electron images with a comparable resolution. Moreover, the nonconductive biological samples can be observed without charging effects if they are thin enough to ensure that a significant fraction of the electron beam crosses the specimen. (literal)

Editore

• AIP, American institute of physics (Editore)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Sviluppo di Modelli Fisici, Simulazioni e Tecniche di Caratterizzazione per le Nanoscienze (MD.P05.004.001) (Modulo)

Autore CNR

• VITTORIO MORANDI (Persona)
• PIER GIORGIO MERLI (Persona)

Insieme di parole chiave

• Parole chiave di "Scanning electron microscopy of thinned specimens: From multilayers to biological samples" (Insieme di parole chiave)

Incoming links:

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Sviluppo di Modelli Fisici, Simulazioni e Tecniche di Caratterizzazione per le Nanoscienze (MD.P05.004.001) (Modulo)

Autore CNR di

• VITTORIO MORANDI (Persona)
• PIER GIORGIO MERLI (Persona)

Editore di

• AIP, American institute of physics (Editore)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied physics letters (Rivista)

Insieme di parole chiave di

• Parole chiave di "Scanning electron microscopy of thinned specimens: From multilayers to biological samples" (Insieme di parole chiave)