Investigation of surface acoustic wave fields in silicon crystals by x-ray diffraction: A dynamical theory approach (Articolo in rivista)

Type
Label
  • Investigation of surface acoustic wave fields in silicon crystals by x-ray diffraction: A dynamical theory approach (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Alternative label
  • Tucoulou R., Mathon O., Ferrero C., Mocella V., Roshchupkin D.V., Kumon R.E. (2005)
    Investigation of surface acoustic wave fields in silicon crystals by x-ray diffraction: A dynamical theory approach
    in Journal of applied physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Tucoulou R., Mathon O., Ferrero C., Mocella V., Roshchupkin D.V., Kumon R.E. (literal)
Pagina inizio
  • 113505 (literal)
Pagina fine
  • 113505 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 97 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • European Synchrotron Radiat Facil, F-38043 Grenoble, France; CNR, IMM, I-80131 Naples, Italy; Russian Acad Sci, Inst Microelect Technol, Chernogolovka 142432, Moscow District, Russia; Univ Windsor, Dept Phys, Windsor, ON N9B 3P4, Canada (literal)
Titolo
  • Investigation of surface acoustic wave fields in silicon crystals by x-ray diffraction: A dynamical theory approach (literal)
Abstract
  • X-ray diffraction spectra at different x-ray energies from a Si crystal subjected to a deformation produced by surface acoustic wave propagation have been modeled using the general framework of dynamical diffraction theory. The simulations have been successfully compared with the corresponding experimental results confirming the accuracy of the elastic model describing the acoustic wave fields inside the crystal. (literal)
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