Silicon planar technology for single-photon optical detectors (Articolo in rivista)

Type
Label
  • Silicon planar technology for single-photon optical detectors (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Sciacca E., Giudice A.C., Sanfilippo D., Zappa F., Lombardo S., Cosentino R., Di Franco C., Ghioni M., Fallica G., Bonanno G., Cova S., Rimini E. (2003)
    Silicon planar technology for single-photon optical detectors
    in I.E.E.E. transactions on electron devices
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Sciacca E., Giudice A.C., Sanfilippo D., Zappa F., Lombardo S., Cosentino R., Di Franco C., Ghioni M., Fallica G., Bonanno G., Cova S., Rimini E. (literal)
Pagina inizio
  • 918 (literal)
Pagina fine
  • 925 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 50 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Univ Catania, Dept Phys, I-95124 Catania, Italy; Politecn Milan, Dipartimento Elettron & InformaZ, I-20133 Milan, Italy; R&D DSG STMicroelect, Catania, Italy; CNR, IMM, Catania, Italy; Osserv Astrofis Catania, I-95125 Catania, Italy (literal)
Titolo
  • Silicon planar technology for single-photon optical detectors (literal)
Abstract
  • Design and fabrication of single photon avalanche detector (SPAD) in planar technology is reported. Device design and critical issues in the technology are discussed. Experimental test procedures are described for dark-counting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency. Low-noise detectors are obtained, with dark counting rates down to 10 c/s for devices with 10 mum diameter, down to 1 kc/s for 50 mum diameter. The technology is suitable for monolithic integration of SPAD detectors and associated circuits. (literal)
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