Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer (Articolo in rivista) (literal)

Anno

• 2003-01-01T00:00:00+01:00 (literal)

Alternative label

• Coppola G., Ferraro P., Iodice M., and De Nicola S. (2003)
  Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer
  in Applied optics
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Coppola G., Ferraro P., Iodice M., and De Nicola S. (literal)

Pagina inizio

• 3882 (literal)

Pagina fine

• 3887 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 42 (literal)

Rivista

• Applied optics (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Istituto per la Microelettronica e i Microsistemi, del Consiglio Nazionale delle Ricerche, Sezione di Napoli, Via P. Castellino, 111, 80131 Naples, Italy Istituto di Cibernetica “E.Caianiello” del Consiglio Nazionale delle Ricerche, Via Campi Flegrei, 34 c/o Comprensorio “Olivetti,” 80072 Pozzuoli, Naples, Italy (literal)

Titolo

• Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer (literal)

Abstract

• A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed. The method is based on a simple, variable lateral-shear, wavelength-scanning interferometer. To achieve highly accurate measurements of both refractive index n and thickness d we use several means to determine these two quantities. We finely tune a distributed-feedback diode laser light source to introduce a phase shift into the detected signal, whereas we make the sample rotate to produce variable lateral shearing. Phase shifting permits precise determination of the optical thickness, nd, whereas refractive index n is obtained from the retrieved phase of the overall interference signal for all incidence angles. (literal)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)

Autore CNR

• MARIO IODICE (Unità di personale interno)
• PIETRO FERRARO (Unità di personale interno)
• GIUSEPPE COPPOLA (Persona)

Incoming links:

Autore CNR di

• PIETRO FERRARO (Unità di personale interno)
• MARIO IODICE (Unità di personale interno)
• GIUSEPPE COPPOLA (Persona)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied optics (Rivista)