http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35134
Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters (Articolo in rivista)
- Type
- Label
- Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters (Articolo in rivista) (literal)
- Anno
- 2002-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/S0169-4332(01)00711-5 (literal)
- Alternative label
Angelucci R., Rizzoli R., Salvatori S., Nicoletti S., Migliori A., Brugnoli E., (2002)
Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters
in Applied surface science; North Holland Pub. Co., Amsterdam (Paesi Bassi)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Angelucci R., Rizzoli R., Salvatori S., Nicoletti S., Migliori A., Brugnoli E., (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR LAMEL--Institute, via Gobetti 101, 40129 Bologna, Italy
INFM Dipartimento di Ingegneria Elettronica, via della Vasca Navale 84, 00146 Roma, Italy (literal)
- Titolo
- Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters (literal)
- Abstract
- Pulsed laser deposition of carbon-based materials has been explored in
order to obtain cold cathode flat emitters with high emission current
density and low threshold field, and to examine the factors controlling the
electron field emission behaviour. In this paper, results on amorphous
carbon thin films deposited on silicon by pulsed laser ablation (PLA) from
a graphite target, using a KrF excimer laser are presented. The structure
and surface morphology of carbon materials have been examined by
transmission electron microscopy (TEM) and Raman spectroscopy. IV
characteristics of the carbon films have been measured by a diode technique
(below 10-4Pa). Some effects of the deposition parameters on thin film
uniformity, adhesion, and field emission performances have been
investigated. Emission current density as high as 50mA/cm2 at an electric
field of 70V/µm has been obtained on 100nm thick, smooth and glassy carbon
films deposited at 150°C. (literal)
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