http://www.cnr.it/ontology/cnr/individuo/prodotto/ID33972
Interfacial reactions during GaN and AiN epitaxy on 4H- and 6H-SiC(0001) (Articolo in rivista)
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- Label
- Interfacial reactions during GaN and AiN epitaxy on 4H- and 6H-SiC(0001) (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.1852703 (literal)
- Alternative label
M. Losurdo , P. Capezzuto, G.Bruno, T.Ho Kim, A.S. Brown, Z. Liliental-Weber (2005)
Interfacial reactions during GaN and AiN epitaxy on 4H- and 6H-SiC(0001)
in Applied physics letters
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. Losurdo , P. Capezzuto, G.Bruno, T.Ho Kim, A.S. Brown, Z. Liliental-Weber (literal)
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- CNR, IMIP, Inst Inorgan Methodol & Plasmas, I-70126 Bari, Italy
2. INSTM, I-70126 Bari, Italy
3. Duke Univ, Dept Elect & Comp Engn, Durham, NC 27709 USA
4. Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA (literal)
- Titolo
- Interfacial reactions during GaN and AiN epitaxy on 4H- and 6H-SiC(0001) (literal)
- Abstract
- Thin layers of AlN and GaN have been grown by plasma-assisted molecular beam epitaxy on Si-face 4H- and 6H-SiC(0001)(Si) substrates. The impact of the SiC surface preparation and oxide removal via a Ga deposition and desorption process on the chemistry and structure of the GaN/SiC and AlN/SiC interfaces, and on the GaN/SiC subsurface reactivity is characterized. We also investigate the impact of this process on growth mode evolution. (literal)
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