Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1063/1.3049613 (literal)

Alternative label

• Riccio, M; Irace, A; Breglio, G; Rossi, L; Barra, M; Di Girolamo, FV; Cassinese, A (2008)
  Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues
  in Applied physics letters
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Riccio, M; Irace, A; Breglio, G; Rossi, L; Barra, M; Di Girolamo, FV; Cassinese, A (literal)

Pagina inizio

• 243504-1 (literal)

Pagina fine

• 243504-3 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 93 (literal)

Rivista

• Applied physics letters (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 3 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• \"[Riccio, M.; Irace, A.; Breglio, G.; Rossi, L.] Department of Biomedical, Electronic and Telecommunication Engineering, University of Naples Federico II, Via Claudio 21, 80125 Naples, Italy [Barra, M.; Di Girolamo, F. V.; Cassinese, A.] CNR-INFM Coherentia and Department of Physics Science, University of Naples Federico II, Piazzale Tecchio 80125, Naples, Italy (literal)

Titolo

• Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues (literal)

Abstract

• In this Letter, a lock-in thermography technique has been used to investigate the actual current distribution profile in the active channel region of organic field effect transistors. The high accuracy of the setup shows an evidence of nonuniformity in the current flow over the device area. The physical origin of this experimental occurrence is tentatively ascribed to a not uniform contact resistance distribution along the channel width or to inhomogeneities in the interface traps distribution. The subsequent implications on the carrier mobility evaluation are discussed too. (literal)

Prodotto di

• Metodologie innovative per lo studio ed il controllo delle proprietà (opto)elettroniche di materiali e dispositivi multifunzionali (MD.P04.026.003) (Modulo)

Autore CNR

• MARIO BARRA (Unità di personale interno)
• ANTONIO CASSINESE (Persona)

Insieme di parole chiave

• Parole chiave di "Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ANTONIO CASSINESE (Persona)
• MARIO BARRA (Unità di personale interno)

Prodotto

• Metodologie innovative per lo studio ed il controllo delle proprietà (opto)elettroniche di materiali e dispositivi multifunzionali (MD.P04.026.003) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied physics letters (Rivista)

Insieme di parole chiave di

• Parole chiave di "Current distribution effects in organic sexithiophene field effect transistors investigated by lock-in thermography: Mobility evaluation issues" (Insieme di parole chiave)