Implications of changes in the injection mechanisms on the low temperature electroluminescence in InGaN/GaN light emitting diodes. (Articolo in rivista)

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  • Implications of changes in the injection mechanisms on the low temperature electroluminescence in InGaN/GaN light emitting diodes. (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Alternative label
  • Pavesi M.; Manfredi M.; Rossi F.; Meneghini M.; Meneghesso G.; Zanoni E. (2008)
    Implications of changes in the injection mechanisms on the low temperature electroluminescence in InGaN/GaN light emitting diodes.
    in Journal of applied physics
    (literal)
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  • Pavesi M.; Manfredi M.; Rossi F.; Meneghini M.; Meneghesso G.; Zanoni E. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 103 (literal)
Rivista
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  • In: Journal of Applied Physics, vol. 103 (2) article n. 024503. American Institute of Physics, 2008. (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Dipartimento di Fisica, Università di Parma, CNR-IMEM, Parma, Department of Information Engineering, University of Padova, Italy (literal)
Titolo
  • Implications of changes in the injection mechanisms on the low temperature electroluminescence in InGaN/GaN light emitting diodes. (literal)
Abstract
  • The presence of traps is sometimes favorable, and sometimes detrimental to the electrical transport and optical efficiency in III-nitride quantum heterostructures. This work presents the results of a joint analysis of electrical features and electroluminescence in InGaN/GaN-based blue light emitting diodes; a detailed and exhaustive reading of the carrier injection mechanisms highlights the central role of trap centers near the active region. Some suggestions will be eventually advanced as to the design of devices with better emission performances. (literal)
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