Dependence of the perpendicular anisotropy in Co/Au multilayers on the number of repetitions (Articolo in rivista)

Type
Label
  • Dependence of the perpendicular anisotropy in Co/Au multilayers on the number of repetitions (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.1557314 (literal)
Alternative label
  • G. Gubbiotti(1), G. Carlotti(1), F. Albertini(2), F. Casoli(3), E. Bontempi(3), L. E. Depero(3), P. Mengucci(4), A. Di Cristoforo(4), H. Koo(5), R. D. Gomez (5) (2003)
    Dependence of the perpendicular anisotropy in Co/Au multilayers on the number of repetitions
    in Journal of applied physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • G. Gubbiotti(1), G. Carlotti(1), F. Albertini(2), F. Casoli(3), E. Bontempi(3), L. E. Depero(3), P. Mengucci(4), A. Di Cristoforo(4), H. Koo(5), R. D. Gomez (5) (literal)
Pagina inizio
  • 7241 (literal)
Pagina fine
  • 7243 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 93 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • (1) INFM, Unita` di Perugia and Dipartimento di Fisica, Via A. Pascoli, 06123 Perugia, Italy (2) IMEM-CNR, Parco Area delle Scienze 37/A, 43010 Fontanini, Parma, Italy (3) INSTM & Laboratorio di Strutturistica Chimica, Dipartimento di Ingegneria Meccanica, Universita` di Brescia, Via Branze, 38, 25123 Brescia, Italy (4) INFM-Unita` di Ancona, Dipartimento di Fisica e Ingegneria dei Materiali e del Territorio, Facolta` di Ingegneria Universita` degli Studi di Ancona, Via Brecce Bianche, I-60131, Ancona, Italy (5) Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742 (literal)
Titolo
  • Dependence of the perpendicular anisotropy in Co/Au multilayers on the number of repetitions (literal)
Abstract
  • The correlations between structure and magnetism in @Co(0.9 nm!/Au(5 nm)#3N multilayer films with different number of repetitions N510, 30, and 50, have been studied by the combined use of complementary structural and magnetic techniques, such as x-ray reflectivity, x-ray diffraction, and transmission electron microscopy, alternating gradient force magnetometry, magnetic force microscopy and Brillouin light scattering. On increasing the value of N, an overall improvement of the multilayer quality is observed which corresponds to a change in the micromagnetic structure and to an enhancement of the perpendicular anisotropy. These effects have been attributed to a reduction of the magnetostatic energy associated with the formation of perpendicular magnetic domains in multilayers with increasing number of layers repetitions. (literal)
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