An adaptive mixed scheme for energy-transport simulations of field-effect transistors (Articolo in rivista)

Type
Label
  • An adaptive mixed scheme for energy-transport simulations of field-effect transistors (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1137/S1064827502418215 (literal)
Alternative label
  • Holst S.; Jüngel A.; Pietra P. (2004)
    An adaptive mixed scheme for energy-transport simulations of field-effect transistors
    in SIAM journal on scientific computing (Print); SIAM Publications, Philadelphia (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Holst S.; Jüngel A.; Pietra P. (literal)
Pagina inizio
  • 1698 (literal)
Pagina fine
  • 1716 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 25 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 5 (literal)
Note
  • Mathematical Reviews on the web (MathSciNet) (literal)
  • Scopu (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Univ Konstanz, Fachbereich Math & Stat, D-78457 Constance, Germany; Istituto di Matematica Applicata e Tecnologie Informatiche CNR, Pavia, Italy (literal)
Titolo
  • An adaptive mixed scheme for energy-transport simulations of field-effect transistors (literal)
Abstract
  • Energy-transport models are used in semiconductor simulations to account for thermal effects. The model consists of the continuity equations for the number and energy of the electrons, coupled to the Poisson equation for the electrostatic potential. The movement of the holes is modeled by drift-diffusion equations, and Shockley-Read-Hall recombination-generation processes are taken into account. The stationary equations are discretized using a mixed-hybrid finite-element method introduced by Marini and Pietra. The two-dimensional mesh is adaptively refined using an error estimator motivated by results of Hoppe and Wohlmuth. The numerical scheme is applied to the simulation of a two-dimensional double-gate MESFET and a deep submicron MOSFET device. (literal)
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