http://www.cnr.it/ontology/cnr/individuo/prodotto/ID295421
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial (Articolo in rivista)
- Type
- Label
- Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1038/lsa.2012.42 (literal)
- Alternative label
Dardano, Principia; Gagliardi, Massimo; Rendina, Ivo; Cabrini, Stefano; Mocella, Vito (2012)
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial
in Light: Science & Applications
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Dardano, Principia; Gagliardi, Massimo; Rendina, Ivo; Cabrini, Stefano; Mocella, Vito (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Consiglio Nazionale delle Ricerche (CNR); Lawrence Berkeley National Laboratory (literal)
- Titolo
- Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial (literal)
- Abstract
- In this work, we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal (PhC) with negative refractive index behavior. In the frequency range in which the effective refractive index n(eff) is equal to -1, the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial. These modes resemble surface plasmon polariton resonances. This finding was confirmed by ellipsometric measurements, demonstrating the isotropy of the PhC resonances. Such negative index PhC materials may be of use in biosensing applications. (literal)
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