Studying the surface reaction between NiO and Al2O3via total reflection EXAFS (ReflEXAFS) (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Studying the surface reaction between NiO and Al2O3via total reflection EXAFS (ReflEXAFS) (Articolo in rivista) (literal)

Anno

• 2014-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1107/S1600577513031299 (literal)

Alternative label

• Tommaso Costanzo, Federico Benzi, Paolo Ghigna, Sonia Pin, Giorgio Spinolo and Francesco d'Acapito (2014)
  Studying the surface reaction between NiO and Al2O3via total reflection EXAFS (ReflEXAFS)
  in Journal of synchrotron radiation (Online)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Tommaso Costanzo, Federico Benzi, Paolo Ghigna, Sonia Pin, Giorgio Spinolo and Francesco d'Acapito (literal)

Pagina inizio

• 395 (literal)

Pagina fine

• 400 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 21 (literal)

Rivista

• Journal of synchrotron radiation (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Università Pavia CNR-IOM Università di camerino paul scherrer institut (literal)

Titolo

• Studying the surface reaction between NiO and Al2O3via total reflection EXAFS (ReflEXAFS) (literal)

Abstract

• The reaction between NiO and (0001)- and (1? 1102)-orientedAl2O3single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protocol for data analysis, based on the recently developedCARDcode, was implemented, and a detailed description of the reactive systems was obtained. In particular, for (1 ? 1102)-oriented Al2O3, the reaction with NiO is almost complete after heating for 6 h at 1273 K, and an almost uniform layer of spinel is found below a mixed (NiO + spinel) layer at the very upmost part of the sample. In the case of the (0001)-oriented Al2O3, for the same temperature and heating time, the reaction shows a lower advancement degree and a residual fraction of at least 30% NiO is detected in the ReflEXAFS spectra. (literal)

Prodotto di

• Sviluppo di strumentazione e di metodologie sperimentali avanzate per lo studio delle proprieta strutturali dei materiali con raggi X da sincrotrone (MD.P04.007.001) (Modulo)

Autore CNR

• FRANCESCO D'ACAPITO (Persona)

Incoming links:

Autore CNR di

• FRANCESCO D'ACAPITO (Persona)

Prodotto

• Sviluppo di strumentazione e di metodologie sperimentali avanzate per lo studio delle proprieta strutturali dei materiali con raggi X da sincrotrone (MD.P04.007.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of synchrotron radiation (Rivista)