http://www.cnr.it/ontology/cnr/individuo/prodotto/ID289101
The use of synchrotron radiation for the characterization of artists' pigments and paintings (Articolo in rivista)
- Type
- Label
- The use of synchrotron radiation for the characterization of artists' pigments and paintings (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1146/annurev-anchem-062012-092702 (literal)
- Alternative label
Janssens, Koen H.; Alfeld, Matthias; Van Der Snickt, Geert; De Nolf, Wout; Vanmeert, Frederik; Radepont, Marie; Monico, Letizia; Dik, Joris; Cotte, Marine; Falkenberg, Gerald; Miliani, Costanza; Brunetti, Brunetto Giovanni (2013)
The use of synchrotron radiation for the characterization of artists' pigments and paintings
in Annual review of analytical chemistry (Palo Alto, Calif.)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Janssens, Koen H.; Alfeld, Matthias; Van Der Snickt, Geert; De Nolf, Wout; Vanmeert, Frederik; Radepont, Marie; Monico, Letizia; Dik, Joris; Cotte, Marine; Falkenberg, Gerald; Miliani, Costanza; Brunetti, Brunetto Giovanni (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.scopus.com/record/display.url?eid=2-s2.0-84879642665&origin=inward (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Universiteit Antwerpen; Delft University of Technology; European Synchrotron Radiation Facility; Deutsche Elektronen-Synchrotron; Universita degli Studi di Perugia (literal)
- Titolo
- The use of synchrotron radiation for the characterization of artists' pigments and paintings (literal)
- Abstract
- We review methods and recent studies in which macroscopic to (sub)microscopic X-ray beams were used for nondestructive analysis and characterization of pigments, paint microsamples, and/or entire paintings. We discuss the use of portable laboratory- and synchrotron-based instrumentation and describe several variants of X-ray fluorescence (XRF) analysis used for elemental analysis and imaging and combined with X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Macroscopic and microscopic (mu-)XRF variants of this method are suitable for visualizing the elemental distribution of key elements in paint multilayers. Technical innovations such as multielement, large-area XRF detectors have enabled such developments. The use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that take place during natural pigment alteration processes. However, synchrotron-based combinations of mu-XRF, mu-XAS, and mu-XRD are suitable for such studies. Copyright © 2013 by Annual Reviews. (literal)
- Prodotto di
- Autore CNR
- Insieme di parole chiave
Incoming links:
- Prodotto
- Autore CNR di
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Insieme di parole chiave di