Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis (Articolo in rivista)

Type
Label
  • Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis (Articolo in rivista) (literal)
Anno
  • 2014-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1364/OL.39.004800 (literal)
Alternative label
  • C.H. van Hoorn (1); D.C. Chavan (1); B. Tiribilli (2); G. Margheri (2); A.J.G. Mank (3); F. Ariese (1) ; D. Iannuzzi (1) (2014)
    Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis
    in Optics letters (Online)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • C.H. van Hoorn (1); D.C. Chavan (1); B. Tiribilli (2); G. Margheri (2); A.J.G. Mank (3); F. Ariese (1) ; D. Iannuzzi (1) (literal)
Pagina inizio
  • 4800 (literal)
Pagina fine
  • 4803 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-39-16-4800 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 39 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 16 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • (1) Department of Physics and Astronomy and Laserlab Amsterdam, VU University, Amsterdam, The Netherlands (2) Institute of Complex Systems, National Research Council, Sesto Fiorentino, Italy (3) Philips Innovation Services, Eindhoven, The Netherlands (literal)
Titolo
  • Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis (literal)
Abstract
  • Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. © 2014 Optical Society of America. (literal)
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