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Dual-angle, self-calibrating Thomson scattering measurements in RFX-MOD (Articolo in rivista)

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Dual-angle, self-calibrating Thomson scattering measurements in RFX-MOD (Articolo in rivista) (literal)

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Alternative label

Giudicotti L.; Pasqualotto R.; Fassina A. (2014)
Dual-angle, self-calibrating Thomson scattering measurements in RFX-MOD
in Review of scientific instruments; AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 (Stati Uniti d'America)
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http://www.scopus.com/inward/record.url?eid=2-s2.0-84905595276&partnerID=q2rCbXpz / Review of scientific instruments (Online) e-ISSN: 1089-7623 / Contributed paper, published as part of the Proceedings of the 20th Topical Conference on High-Temperature Plasma Diagnostics, Atlanta, Georgia, USA, June 2014 (literal)

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http://scitation.aip.org/content/aip/journal/rsi/85/11/10.1063/1.4890409 (literal)

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1,2,3 : Consorzio RFX, Corso Stati Uniti, 4, 35127 Padova, Italy; / 1 : Department of Industrial Engineering, Padova University, Via Gradenigo 6/a, 35131 Padova, Italy. (literal)

Titolo

Dual-angle, self-calibrating Thomson scattering measurements in RFX-MOD (literal)

Abstract

In the multipoint Thomson scattering (TS) system of the RFX-MOD experiment the signals from a few spatial positions can be observed simultaneously under two different scattering angles. In addition the detection system uses optical multiplexing by signal delays in fiber optic cables of different length so that the two sets of TS signals can be observed by the same polychromator. Owing to the dependence of the TS spectrum on the scattering angle, it was then possible to implement self-calibrating TS measurements in which the electron temperature Te, the electron density ne and the relative calibration coefficients of spectral channels sensitivity Ci were simultaneously determined by a suitable analysis of the two sets of TS data collected at the two angles. The analysis has shown that, in spite of the small difference in the spectra obtained at the two angles, reliable values of the relative calibration coefficients can be determined by the analysis of good S/N dual-angle spectra recorded in a few tens of plasma shots. This analysis suggests that in RFX-MOD the calibration of the entire set of TS polychromators by means of the similar, dual-laser (Nd:YAG/Nd:YLF) TS technique, should be feasible. (literal)

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