http://www.cnr.it/ontology/cnr/individuo/prodotto/ID282538
FROM NANOVOIDS TO BLISTERS IN HYDROGENATED AMORPHOUS SILICON (Contributo in atti di convegno)
- Type
- Label
- FROM NANOVOIDS TO BLISTERS IN HYDROGENATED AMORPHOUS SILICON (Contributo in atti di convegno) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1142/9789814460187_0044 (literal)
- Alternative label
Frigeri, C.; Nasi, L.; Serenyi, M.; Khanh, N. Q.; Szekrenyes, Zs; Kamaras, K.; Csik, A. (2013)
FROM NANOVOIDS TO BLISTERS IN HYDROGENATED AMORPHOUS SILICON
in International Conference on Physics, Chemistry and Applications of Nanostructures (NANOMEETING), Minsk, BYELARUS, May 28-31, 2013
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Frigeri, C.; Nasi, L.; Serenyi, M.; Khanh, N. Q.; Szekrenyes, Zs; Kamaras, K.; Csik, A. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.worldscientific.com/doi/abs/10.1142/9789814460187_0044 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume
- PHYSICS, CHEMISTRY AND APPLICATIONS OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES - Proceedings of International Conference Nanomeeting - 2013 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR-IMEM Institute, Parco Area delle Scienze 37/A, I- 43100 Parma, Italy; MTA-MFA Institute, Konkoly-Thege ut 29-33, H-1121 Budapest, Hungary; Institute for Solid State Physics and Optics, Wigner Research Centre for Physics, Hungarian Academy of Sciences, H-1525 Budapest, Hungary; Institute of Nuclear Research of HAS, Bem tér 18/C, H-4001 Debrecen, Hungary (literal)
- Titolo
- FROM NANOVOIDS TO BLISTERS IN HYDROGENATED AMORPHOUS SILICON (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
- 978-981-4460-17-0 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#curatoriVolume
- Borisenko, VE; Gaponenko, SV; Gurin, VS; Kam, CH (literal)
- Abstract
- AFM and FTIR spectroscopy were applied to study the relationship between surface blisters and nanovoids in annealed hydrogenated a-Si. The influence of the H bonding configuration on the way the nanovoids give rise to the blisters is discussed. Annealing causes an increase of the polymers density. As they reside on the voids walls their density increase causes an increase of the voids volume. The polymers may release H inside the voids with creation of H-2 gas, whose expansion, upon annealing, further contributes to the volume increase of the voids till the formation of surface blisters. (literal)
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