http://www.cnr.it/ontology/cnr/individuo/prodotto/ID281994
HT-XRD analysis of W thick coatings for nuclear fusion technology (Articolo in rivista)
- Type
- Label
- HT-XRD analysis of W thick coatings for nuclear fusion technology (Articolo in rivista) (literal)
- Anno
- 2014-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.4028/www.scientific.net/KEM.605.31 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Costanza G.; Donnini R.; Kaciulis S.; Maddaluno G.; Montanari R. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- 3rd International Conference on Materials and Applications for Sensors and Transducers, IC-MAST 2013; Prague; Czech Republic; 13 September 2013 through 17 September 2013; Code 105108 (literal)
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- http://www.scientific.net/KEM.605.31 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1,5 : Dept. of Industrial Engineering, University of Rome Tor Vergata, Via del Politecnico 1, Rome, Italy /
2 : Institute for Energetics and Interphases IENI-CNR, Via R.Cozzi 53, Milan, Italy /
3 : Institute for Study of Nanostructured Materials, ISMN-CNR, Monterotondo Stazione, P.O. Box 10, Rome, Italy /
4 : EURATOM-ENEA Fusion Association, C.R. Frascati, CP65, Frascati, Rome, Italy (literal)
- Titolo
- HT-XRD analysis of W thick coatings for nuclear fusion technology (literal)
- Abstract
- W is a promising material to use as protection for thermal shields in future nuclear fusion reactors, however the joining to other metals is really challenging. For realizing such joints plasma spraying (PS) has been used for its simplicity, the possibility to cover complex and extended surfaces and the relatively low cost. An appropriate interlayer must be optimized to increase the adhesion of W on the substrates and to provide a soft interface for better thermo-mechanical compatibility. The present work demonstrates that high-temperature X-ray diffraction (HT-XRD) permits to quickly assess the reliability and quality of the coating-interlayer-substrate system by measuring the strain of coating. This is very useful to orientate the work for optimizing the structure and composition of the interlayer and the parameters of deposition process. © (2014) Trans Tech Publications. (literal)
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