Electro-optic and dielectric properties of epitaxial Pb1 - 3x/2LaxZr0.2Ti0.8O3 thin films obtained by pulsed laser deposition (Articolo in rivista)

Type
Label
  • Electro-optic and dielectric properties of epitaxial Pb1 - 3x/2LaxZr0.2Ti0.8O3 thin films obtained by pulsed laser deposition (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.tsf.2012.11.119 (literal)
Alternative label
  • N.D. Scarisoreanu (a,b); F. Craciun (c); A. Andrei (b); V. Ion (b); R. Birjega (b); A. Moldovan (b); M. Dinescu (b); C. Galassi (d) (2013)
    Electro-optic and dielectric properties of epitaxial Pb1 - 3x/2LaxZr0.2Ti0.8O3 thin films obtained by pulsed laser deposition
    in Thin solid films (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • N.D. Scarisoreanu (a,b); F. Craciun (c); A. Andrei (b); V. Ion (b); R. Birjega (b); A. Moldovan (b); M. Dinescu (b); C. Galassi (d) (literal)
Pagina inizio
  • 127 (literal)
Pagina fine
  • 130 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S0040609012016203 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 541 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • August (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • a) National Institute for Research and Development in Microtehnologies, Iancu Nicolae 126A, 077190 Bucharest, Romania b) National Institute for Laser, Plasma and Radiation Physics, PO Box MG-16 Magurele, 077125 Bucharest, Romania c) CNR-ISC, Istituto dei Sistemi Complessi, Via del Fosso del Cavaliere 100, I-00133 Rome, Italy d) CNR-ISTEC, Via Granarolo 64, I-48018 Faenza, Italy (literal)
Titolo
  • Electro-optic and dielectric properties of epitaxial Pb1 - 3x/2LaxZr0.2Ti0.8O3 thin films obtained by pulsed laser deposition (literal)
Abstract
  • The electro-optic behavior and dielectric properties of Pb1-3x/2LaxZr0.2Ti0.8O3, x=0.22 (PLZT 22/20/80) thin films have been studied due to the potential applicability of such composition in electro-optical devices. The PLZT (22/20/80) thin films, deposited by pulsed laser deposition, have been placed between specific conductive electrodes for obtaining the refractive index variation under the effect of an applied electric field. These birefringence variations have been measured by variable angle spectroscopic ellipsometry. PLZT films with different textures and orientations were obtained. Structural, chemical and morphologic properties of PLZT thin films have been investigated by X-ray diffraction, sputtered neutral mass spectroscopy and atomic force microscopy techniques. Piezoresponse properties have been also measured. Dielectric spectroscopy measurements have been used to characterize dielectric relaxation in thin film structures in the frequency range from 100 Hz up to 1 MHz, high values of dielectric permittivity (??~1400) and low dielectric loss (tan?~2%) were observed. (literal)
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