A competing risks model with degradation phenomena and catastrophic failures (Articolo in rivista)

Type
Label
  • A competing risks model with degradation phenomena and catastrophic failures (Articolo in rivista) (literal)
Anno
  • 2014-01-01T00:00:00+01:00 (literal)
Alternative label
  • Cha J.H. 1, Guida M. 2-3, Pulcini G. 3 (2014)
    A competing risks model with degradation phenomena and catastrophic failures
    in International Journal of Performability Engineering
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Cha J.H. 1, Guida M. 2-3, Pulcini G. 3 (literal)
Pagina inizio
  • 63 (literal)
Pagina fine
  • 74 (literal)
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  • http://www.ijpe-online.com/january-2014-p7-a-competing-risks-model-with-degradation-phenomena-and-catastrophic-failures.html#axzz2pLXFLB6S (literal)
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  • 10 (literal)
Rivista
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  • 12 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1 (literal)
Note
  • Scopu (literal)
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  • 1) Department of Statistics, Ewha Womans University, Seoul 120-750, KOREA; 2) Department of Electrical Engineering, Computer Engineering, and Applied Mathematics, University of Salerno, Fisciano (SA), 84084 ITALY; 3) Istituto Motori, CNR, Napoli, 80125 ITALY. (literal)
Titolo
  • A competing risks model with degradation phenomena and catastrophic failures (literal)
Abstract
  • This paper proposes a competing risks model for the reliability analysis of units subject both to degradation phenomena and catastrophic failures. The paper is mainly addressed to the analysis of real data presented in Huang and Askin (2003) which refer to some electronic devices subject to two independent failure modes. The first mode is the light intensity degradation, which is treated as a degradation phenomenon since the light intensity is observed and measured at given inspection times. The other failure mode is the solder/Cu pad interface fracture, which is classified as a catastrophic failure. The main reliability characteristics, such as the probability density functions and the cumulative distribution functions of each failure mode in the presence of both modes, are estimated. Likewise, the estimate of the hazard function, of the unit reliability under the competing risks model, and of the proportion of failures caused by each failure mode are derived. (literal)
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