Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (Brevetto)

Type
Label
  • Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (Brevetto) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Coppola, Giuseppe Ferraro, Pietro Iodice, Mario De Nicola, Sergio (2003)
    Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure
    (literal)
Titolo
  • Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Coppola, Giuseppe Ferraro, Pietro Iodice, Mario De Nicola, Sergio (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#proprieta
  • CNR (literal)
Http://www.cnr.it/ontology/cnr/brevetti.owl#tipoDiBrevetto
  • Europeo (literal)
Numero brevetto
  • EP1384973 A3 (literal)
Anno di deposito
  • 2003 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IMM - CNR UOS di Napoli INO - CNR UOS di Pozzuoli (literal)
Titolo
  • Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (literal)
Http://www.cnr.it/ontology/cnr/brevetti.owl#annoDiConcessione
  • 2005 (literal)
Prodotto di
Autore CNR

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