A NEW UPGRADE OF THE PORTABLE PIXE-ALPHA AND XRD SYSTEMS AND THEIR INTEGRATED APPLICATION FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF ANCIENT PIGMENTS (Abstract/Comunicazione in atti di convegno)

Type
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  • A NEW UPGRADE OF THE PORTABLE PIXE-ALPHA AND XRD SYSTEMS AND THEIR INTEGRATED APPLICATION FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF ANCIENT PIGMENTS (Abstract/Comunicazione in atti di convegno) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Alternative label
  • F.P. Romano, G. Pappalardo, L. Pappalardo, F. Rizzo (2013)
    A NEW UPGRADE OF THE PORTABLE PIXE-ALPHA AND XRD SYSTEMS AND THEIR INTEGRATED APPLICATION FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF ANCIENT PIGMENTS
    in Micro-analytical Techniques Based on Nuclear Spectrometry for Environmental Monitoring and Material Studies, Catania, 27-31 Maggio 2013
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • F.P. Romano, G. Pappalardo, L. Pappalardo, F. Rizzo (literal)
Note
  • Comunicazione (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IBAM-CNR, Via Biblioteca 4, 95124 Catania LNS-INFN, Via S. Sofia 62, 95123 Catania Dipartimento Fisica e Astronomia, Univ. di Catania, Via S. Sofia 62, 95123 Catania (literal)
Titolo
  • A NEW UPGRADE OF THE PORTABLE PIXE-ALPHA AND XRD SYSTEMS AND THEIR INTEGRATED APPLICATION FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF ANCIENT PIGMENTS (literal)
Abstract
  • The use of portable systems for the non destructive characterization of samples in the cultural heritage field can give useful information for their knowledge and the conservation. In the present work a new upgrade of the portable PIXE-alpha ?spectrometer and of the portable XRD system, realized at the LANDIS laboratory of the LNS-INFN and IBAM-CNR of Catania is proposed. In particular a new portable 210Po alpha source will be designed and realized at the class A LAB-alpha facility of the LNS-INFN and it will be coupled to a new 20 mm2 SDD detector with 125 eV energy resolution at 5.9 keV in order to improve both the MDL of the portable PIXE system and the analysis of K-lines of low Z elements and M-lines of the heavy ones in the low energy region (starting from about the Cu L-line at 0.9 keV). The present XRD system operating at the LANDIS laboratory will be equipped with a new mechanics in order to enable the diffraction measurement at low angles (3-4° versus the actual minimum at 12°) and a new microfocus x-ray tube coupled to a slightly focusing polycapillary optics for operate with a low divergence beam. These improvements will enable a better identifications of some minerals that can not be characterized in the present version of the apparatus. The new systems will be combined in order to evidence the possibility to obtain an absolute quantitative analysis of ancient pigments (wall paintings and/or pigments in archaeological pottery) with a method previously realized at the LANDIS laboratory of Catania. (literal)
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