Critically coupled silicon Fabry-Perot photodetectors based on the internal photoemission effect at 1550 nm (Articolo in rivista)

Type
Label
  • Critically coupled silicon Fabry-Perot photodetectors based on the internal photoemission effect at 1550 nm (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1364/OE.20.012599 (literal)
Alternative label
  • Maurizio Casalino and Giuseppe Coppola and Mario Iodice and Ivo Rendina and Luigi Sirleto (2012)
    Critically coupled silicon Fabry-Perot photodetectors based on the internal photoemission effect at 1550 nm
    in Optics express; Optical Society of America, Washington (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Maurizio Casalino and Giuseppe Coppola and Mario Iodice and Ivo Rendina and Luigi Sirleto (literal)
Pagina inizio
  • 12599 (literal)
Pagina fine
  • 12609 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.opticsexpress.org/abstract.cfm?URI=oe-20-11-12599 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 20 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 11 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto per la Microelettronica e Microsistemi (IMM) - Consiglio Nazionale delle Ricerche - Sez. Napoli Italy (literal)
Titolo
  • Critically coupled silicon Fabry-Perot photodetectors based on the internal photoemission effect at 1550 nm (literal)
Abstract
  • In this paper, design, fabrication and characterization of an all-silicon photodetector (PD) at 1550 nm, have been reported. Our device is a surface-illuminated PD constituted by a Fabry-Perot microcavity incorporating a Cu/p-Si Schottky diode. Its absorption mechanism, based on the internal photoemission effect (IPE), has been enhanced by critical coupling condition. Our experimental findings prove a peak responsivity of 0.063 mA/W, which is the highest value obtained in a surface-illuminated IPE-based Si PD around 1550 nm. Finally, device capacitance measurements have been carried out demonstrating a capacitance < 5 pF which has the potential for GHz operation subject to a reduction of the series resistance of the ohmic contact. (literal)
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