http://www.cnr.it/ontology/cnr/individuo/prodotto/ID253826
Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique (Articolo in rivista)
- Type
- Label
- Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique (Articolo in rivista) (literal)
- Anno
- 2000-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.1150597 (literal)
- Alternative label
Gauzzi, A; Le Cochec, J; Lamura, G; Jonsson, BJ; Gasparov, VA; Ladan, FR; Placais, B; Probst, PA; Pavuna, D; Bok, J (2000)
Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique
in Review of scientific instruments; AMER INST PHYSICS, MELVILLE, NY (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Gauzzi, A; Le Cochec, J; Lamura, G; Jonsson, BJ; Gasparov, VA; Ladan, FR; Placais, B; Probst, PA; Pavuna, D; Bok, J (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Ecole Super Phys & Chim Ind, Lab Phys Solide, F-75231 Paris, France
CNR, MASPEC, I-43010 Parma, Italy
Ecole Polytech Fed Lausanne, Dept Phys, CH-1015 Lausanne, Switzerland
Ecole Normale Super, Phys Mat Condensee Lab, CNRS, UMR 8551, F-75231 Paris 5, France
Univ Paris 06, F-75231 Paris 5, France
Univ Paris 07, F-75231 Paris 5, France
Sci Consulting, CH-1603 Grandvaux, Switzerland
Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia (literal)
- Titolo
- Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique (literal)
- Abstract
- Abstract: We describe a novel single-coil mutual inductance technique for measuring the magnetic penetration depth lambda of superconductors at 2-4 MHz as a function of temperature in the 4-100 K range. We combine a single-coil configuration with a high-stability marginal oscillator; this enables us to measure the absolute value of lambda on both bulk samples and thin films with very high resolution (delta lambda=10 pm) and a precision of 30 nm. As example of application, we report measurements on NbTi bulk samples and Nb films. This contactless technique is suited for probing the superconducting properties of samples over large surfaces. (literal)
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