Add to Marked List (0) Send to: Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Add to Marked List (0) Send to: Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation (Articolo in rivista) (literal)

Anno

• 1999-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1107/S0021889898012151 (literal)

Alternative label

• D'Acapito, F (D'Acapito, F); Zontone, F (Zontone, F) (1999)
  Add to Marked List (0) Send to: Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation
  in Journal of applied crystallography
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• D'Acapito, F (D'Acapito, F); Zontone, F (Zontone, F) (literal)

Pagina inizio

• 234 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 32 (literal)

Rivista

• Journal of applied crystallography (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• cnr (literal)

Titolo

• Add to Marked List (0) Send to: Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation (literal)

Abstract

• A novel X-ray technique is described for carrying out structural investigations of metallic nanoparticles buried in glass obtained by ion implantation. The method consists of maximizing the scattering contribution of the cluster-rich layer by working at the critical angle for total external reflection at the implanted-layer-substrate interface. By using the refracted beam as a probe, the diffraction profile of the metallic clusters in very dilute samples can be extracted by a simple subtraction procedure. The new procedure is applied to SiO2 glasses implanted with Ag ions. The study was performed at the European Synchrotron Radiation Facility. The results indicate that a complete structural investigation can be performed by using highly collimated, very intense synchrotron radiation beams, a grazing-incidence geometry and two-dimensional detectors. The procedure is shown to be very useful for complementing the information from electron techniques (transmission electron microscopy, micro-beam electron diffraction) and X-ray spectroscopic (EXAFS) methods. In particular, the accuracy of the lattice-parameter determination is shown to be a factor of nine better than the accuracy of EXAFS results. (literal)

Prodotto di

• Sviluppo di strumentazione e di metodologie sperimentali avanzate per lo studio delle proprieta strutturali dei materiali con raggi X da sincrotrone (MD.P04.007.001) (Modulo)

Autore CNR

• FRANCESCO D'ACAPITO (Persona)

Incoming links:

Autore CNR di

• FRANCESCO D'ACAPITO (Persona)

Prodotto

• Sviluppo di strumentazione e di metodologie sperimentali avanzate per lo studio delle proprieta strutturali dei materiali con raggi X da sincrotrone (MD.P04.007.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of applied crystallography (Rivista)