Oxygen K-edge NEXAFS studies of thin Cs oxide films (Articolo in rivista)

Type
Label
  • Oxygen K-edge NEXAFS studies of thin Cs oxide films (Articolo in rivista) (literal)
Anno
  • 1992-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/0039-6028(92)91334-8 (literal)
Alternative label
  • M. Pedio, M. Benfatto, S. Aminpirooz, J. Haase (1992)
    Oxygen K-edge NEXAFS studies of thin Cs oxide films
    in Surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M. Pedio, M. Benfatto, S. Aminpirooz, J. Haase (literal)
Pagina inizio
  • 691 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 269 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto dt Strutttua della Materta, C N R, V E Fermi 38, I-00044 Frascati, Italy Laboratori Nazionali Frascati (INFN), V E Fermi 40, I-00044 Frascati, Italy FHI der MPG, Faradayweg 4-6, W-1000 Berlin 33, Germany (literal)
Titolo
  • Oxygen K-edge NEXAFS studies of thin Cs oxide films (literal)
Abstract
  • Near-edge X-ray absorption fine structure (NEXAFS) studies of oxygen interaction with thin films of polycristalline cesium show the evolution of different Cs oxides with increasing oxygen exposure. Multiple scattering calculations indicate that the system prepared by co-deposition of Cs and oxygen at 120 K has a CsO2 structure and that the resonance at about 537 eV corresponds to scattering events involving the oxygen in the O2- form with an O-O bond length of 1.40+/-0.05 angstrom. (literal)
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