Spectroscopic assessment of titania and hafnia silica-based planar waveguides (Comunicazione a convegno)

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  • Spectroscopic assessment of titania and hafnia silica-based planar waveguides (Comunicazione a convegno) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Alternative label
  • R.M. Almeida, A.C. Marques, S. Pelli, G.C. Righini, A. Chiasera, M. Matterelli, M. Montagna, C. Tosello, R.R. Gonçalves, H. Portales, S. Chaussedent, M. Ferrari, L. Zampedri (2004)
    Spectroscopic assessment of titania and hafnia silica-based planar waveguides
    in 9th International Workshop on Disordered Systems, Andalo (Italy), 10-13 March 2003
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • R.M. Almeida, A.C. Marques, S. Pelli, G.C. Righini, A. Chiasera, M. Matterelli, M. Montagna, C. Tosello, R.R. Gonçalves, H. Portales, S. Chaussedent, M. Ferrari, L. Zampedri (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Depart. Eng. de Materiais, Instituto Superior Técnico, Av. Rovisco Pais, 1049-001 Lisboa, Portugal. CNR-IFAC, Institute of Applied Physics \"Nello Carrara\", Via Panciatichi 64, 5 0127 Firenze, Italy. Dip. di Fisica e INFM, Università di Trento, via Sommarive 14, 38050 Povo-Trento, Italy. Dip.di Ing. dei Materiali, Università di Trento, via Mesiano 44, 38050 Povo-Trento, Italy. Dipartimento di Fisica and INFM, Università di Padova, via Marzolo 8, I-35131 Padova, Italy. Laboratoire POMA UMR CNRS 6136, Université d`Angers, 2 bd Lavoisier, F-49045 Angers, France CNR-IFN, Institute of Photonics and Nanotechnologies, CSMFO group, via Sommarive 14, 38050 Povo-Trento, Italy. (literal)
Titolo
  • Spectroscopic assessment of titania and hafnia silica-based planar waveguides (literal)
Abstract
  • Silicate-based glasses remain the most investigated systems for optical planar waveguides, since they offer a reasonable solubility for rare-earth ions, they are transparent in the NIR-Visible region and they are compatible with Integrated Optics (IO) technology. In the last decade, various technologies have been employed for the fabrication of silica-based IO components and a broad variety of silica-based systems have been investigated. Among the different binary systems, SiO2 - TiO2 has been extensively employed, mainly because it offers the possibility of producing planar waveguides with a controlled refractive index, depending on the TiO2 / SiO2 ratio. Recently, it has been shown that SiO2 - HfO2 could be a further viable system for 1.5 ?m applications. In fact, HfO2 is transparent over a wide range of wavelengths, it exhibits high refractive index and allows the preparation of good optical quality waveguides. This paper compares spectroscopic results, in particular photoluminescence and vibrational spectra, in order to assess optical and structural properties of erbium-activated silica-titania and silica-hafnia planar waveguides, prepared by two different techniques: radio-frequency sputtering and sol-gel. Particular attention is devoted to the homogeneity of the material structures obtained in each case. (literal)
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