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Integrated analysis of non-linear loss mechanisms in Yb:YAG ceramics for laser applications (Articolo in rivista)
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- Integrated analysis of non-linear loss mechanisms in Yb:YAG ceramics for laser applications (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.jeurceramsoc.2012.02.047 (literal)
- Alternative label
Esposito, Laura; Epicier, Thierry; Serantoni, Marina; Piancastelli, Andreana; Alderighi, Daniele; Pirri, Angela; Toci, Guido; Vannini, Matteo; Anghel, Sergiu; Boulon, Georges (2012)
Integrated analysis of non-linear loss mechanisms in Yb:YAG ceramics for laser applications
in Journal of the European Ceramic Society
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Esposito, Laura; Epicier, Thierry; Serantoni, Marina; Piancastelli, Andreana; Alderighi, Daniele; Pirri, Angela; Toci, Guido; Vannini, Matteo; Anghel, Sergiu; Boulon, Georges (literal)
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- ID_PUMA: cnr.istec/2012-A0-018. Area di valutazione: 03 - Scienze chimiche. (literal)
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- http://www.sciencedirect.com/science/article/pii/S0955221912001215 (literal)
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- ISI Web of Science (WOS) (literal)
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- CNR-ISTEC, Faenza; Matériaux, Ingénierie et Sciences (MATEIS), UMR 5510 CNRS, Université de Lyon, INSA-Lyon, 69621 Villeurbanne, France; Daunia Solar Cell, Forlì, Italy; CNR-IFAC, Sesto Fiorentino; Physical Chemistry of Luminescent Materials (LPCML), University of Lyon, UCBLyon1, UMR 5620 CNRS, 69622 Villeurbanne, France (literal)
- Titolo
- Integrated analysis of non-linear loss mechanisms in Yb:YAG ceramics for laser applications (literal)
- Abstract
- Transparent 9.8 at% Yb:YAG ceramic samples were prepared by reactive sintering of commercial oxides and using 0 or 1 wt% polyethylene glycol (PEG) as dispersant. The optical quality of the samples turns out to be improved by using a dispersant and optical transmittance close to the commercial samples has been obtained. On the other hand the laser characterization evidenced the activation of a non-linear loss mechanism occurring only in the sample containing PEG and despite its better optical quality, at high excitation level. A SEM analysis of material microstructure could not explain this behavior. A state of the art TEM analysis at nanometric scale was performed providing high resolution chemical spectroscopic results that indicate the presence of amorphous and crystalline silicate phases playing different roles in the two samples. (C) 2012 Elsevier Ltd. All rights reserved. (literal)
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