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Control of Semiconductor Particle Size in Sol-Gel Thin Films (Articolo in rivista)

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Label

Control of Semiconductor Particle Size in Sol-Gel Thin Films (Articolo in rivista) (literal)

Anno

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M. Guglielmi, A. Martucci, E. Menegazzo, G. C. Righini, S. Pelli, J. Fick, G. Vitrant (1997)
Control of Semiconductor Particle Size in Sol-Gel Thin Films
in Journal of sol-gel science and technology; Springer, Berlin (Germania)
(literal)

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M. Guglielmi, A. Martucci, E. Menegazzo, G. C. Righini, S. Pelli, J. Fick, G. Vitrant (literal)

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Dipartimento di Ingegneria Meccanica, Settore Materiali, Via Marzolo 9, 35131 Padova, Italy I.R.O.E.-C.N.R., Via Panciatichi 64, 50125 Firenze, Italy Lab. d'Electromagnetisme M., ENSERG, BP 257, 38016 Grenoble, France (literal)

Titolo

Abstract

Thin silica and silica-titania films containing CdS and PbS quantum size particles were obtained by separate preparation of the matrix and the colloidal sols and successive mixing. Sulfide particles were obtained by reaction of metal acetates with thioacetamide and control of particle size was achieved by surface capping agents. Powders and thin films deposited on soda-lime slides were prepared and characterized by XRD. Absorption spectra were recorded on films. The nonlinear refractive index was measured by an m-line technique on a CdS-doped sample. The nonlinear effect was found to be reversible and a n2 value of -3 10-9 cm2/kW was measured. (literal)

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